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Opportunity
Research

Research Associate Physics

Brookhaven National Laboratory

Hours
Full time
Where
Upton, NY
Posted
Yesterday

Brookhaven National Laboratory (BNL) is entering an exciting new chapter with one of the newest and most advanced synchrotron facilities in the world. National Synchrotron Light Source II (NSLS-II) enables the study of material properties and functions with nanoscale resolution and exquisite sensitivity by providing world-leading capabilities for X-ray imaging and high-resolution energy analysis. This facility is open to users from academia and industry, and its operations are at a time when the world enters a new era with a global economy fueled largely by scientific discoveries and technological innovations.

What you'd do

  • Establish and document the OCMM baseline, including hardware configuration, sensor and stage behavior, calibration records, and reproducible operating procedures.
  • Perform controlled experiments to characterize and separate sensor noise, mounting compliance, mechanical drift, thermal effects, and reconstruction-induced errors.
  • Diagnose sensor range limitations and data dropouts, then develop protocols to flag invalid or marginal measurements and evaluate their impact on reconstructed profiles.
  • Improve the robustness of the OCMM surface-reconstruction method using singular value decomposition to identify and characterize poorly constrained measurement modes.
  • Screen and optimize candidate measurement geometries through analytical analysis and experimental validation.
  • Develop and integrate validated scan and reconstruction strategies into acquisition and analysis software.
  • Implement quality checks and automated diagnostics to detect anomalous inputs, missing samples, range violations, inconsistent geometries, and configuration mismatches.
  • Validate the controlled OCMM workflow using progressively more demanding X-ray mirror reference surfaces.
  • Compare OCMM measurements with high-quality reference data from NSP, FSI, CSI, and other BNL metrology methods, document registration, filtering, aperture, and quantitative agreement or discrepancies.
  • Provide root-cause analysis when hardware limits prevent reliable measurement of demanding mirrors and identify mitigation strategies or system upgrades.
Starts
2026-09-15